Method for forming insulating film and method for...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – By reaction with substrate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S769000, C438S775000, C438S778000, C438S785000, C438S792000, C257SE21268

Reexamination Certificate

active

07960293

ABSTRACT:
A method for forming an insulating film includes forming a silicon nitride film on a silicon surface by subjecting a target substrate wherein silicon is exposed in the surface to a treatment for nitriding the silicon, forming a silicon oxynitride film by heating the target substrate provided with the silicon nitride film in an N2O atmosphere, and nitriding the silicon oxynitride film.

REFERENCES:
patent: 6037205 (2000-03-01), Huh et al.
patent: 6399520 (2002-06-01), Kawakami et al.
patent: 6470824 (2002-10-01), Kawakami et al.
patent: 6767847 (2004-07-01), Hu et al.
patent: 2003/0042557 (2003-03-01), Shimamoto et al.
patent: 2005/0064667 (2005-03-01), Matsushita et al.
patent: 5 251439 (1993-09-01), None
patent: 7 221092 (1995-08-01), None
patent: 10 135207 (1998-05-01), None
patent: 2000 260707 (2000-09-01), None
patent: 2005 93865 (2005-04-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for forming insulating film and method for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for forming insulating film and method for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for forming insulating film and method for... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2670890

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.