Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having schottky gate
Reexamination Certificate
2005-12-19
2008-10-07
Coleman, W. David (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having schottky gate
C438S197000, C257SE25012, C257SE27016
Reexamination Certificate
active
07432143
ABSTRACT:
There is provided a method for forming a gate using a gate layout of a semiconductor device. The layout includes an active region with a stepped side boundary, a plurality of gates crossing over the active region, and tabs attached to the gates on the side boundary of the active region, wherein two tabs adjacent by a topology of the stepped side boundary are disposed in an oblique direction. The gates can be patterned.
REFERENCES:
patent: 5596207 (1997-01-01), Krishnan et al.
patent: 5652441 (1997-07-01), Hashimoto et al.
patent: 5665623 (1997-09-01), Liang et al.
patent: 5732009 (1998-03-01), Tadaki et al.
patent: 6346427 (2002-02-01), Gardner et al.
patent: 6929965 (2005-08-01), Chen et al.
patent: 2004/0038476 (2004-02-01), Tran
patent: 2004/0147114 (2004-07-01), Park et al.
patent: 2005/0145940 (2005-07-01), Maeda et al.
patent: 2006/0060936 (2006-03-01), Park et al.
patent: 10-1999-011889 (1999-02-01), None
patent: 1999-011889 (1999-02-01), None
patent: 10-2001-0084292 (2001-09-01), None
patent: 10-2003-0058679 (2003-07-01), None
patent: 10-2004-0013460 (2004-02-01), None
Cho Min-hee
Kim Ji-young
Coleman W. David
Mills & Onello LLP
Samsung Electronics Co,. Ltd.
Singal Ankush k
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