Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2005-12-06
2005-12-06
Zarabian, Amir (Department: 2822)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S634000, C438S740000, C438S756000
Reexamination Certificate
active
06972253
ABSTRACT:
A method for fabricating dielectric barrier layers in integrated circuit structures such as damascene structures is provided. In one embodiment, a low-k dielectric layer formed on a substrate is provided. The low-k dielectric layer has at least one opening exposing an underlying metal layer. A first silicon carbide barrier layer is formed to conformally cover the exposed surfaces of the opening. A portion of the first silicon carbide barrier layer above the low-k dielectric layer and over the bottom of the opening is converted with an oxidation treatment into a layer of silicon oxide. The silicon oxide layer is removed above the low-k dielectric layer and from the bottom of the opening. The opening is filled with a conductive layer in electrical contact with the underlying metal layer. The conductive layer is removed above the low-k dielectric layer to a predetermined depth below the low-k dielectric layer to define a recess therebelow. A second silicon carbide barrier layer is formed to cover the recess and above the low-k dielectric layer and the first silicon carbide barrier layer so as to seal the top of the structure. A portion of the second silicon carbide barrier layer above the low-k dielectric layer is converted with an oxidation treatment into a layer of silicon oxide. The layer of silicon oxide is then removed and the metal conductive layer is fully encapsulated by the silicon carbide barrier layer.
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Jang Syun-Ming
Liu Ai-Sen
Duong Khanh
Haynes and Boone LLP
Taiwan Semiconductor Manufacturing Company , Ltd.
Zarabian Amir
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