Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface
Reexamination Certificate
2005-09-29
2010-11-16
Zimmer, Marc S (Department: 1796)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Forming nonplanar surface
C430S270100, C430S313000, C427S387000, C427S096300, C428S447000, C528S031000, C528S041000, C528S043000
Reexamination Certificate
active
07833696
ABSTRACT:
Silsesquioxane resins useful in forming the antireflective coating having the formula (PhSiO(3-x)/2(OH)x)mHSiO(3-x)/2(OH)x)n(MeSiO(3-x)/2(OH)x)p(RSiO(3-x)/2(OH)x)qwhere Ph is a phenyl group, Me is a methyl group, R is selected from ester groups and polyether groups, x has a value of 0, 1 or 2; m has a value of 0.05 to 0.95, n has a value of 0.05 to 0.95, p has a value of 0.05 to 0.95, q has a value of 0.01 to 0.30 and m+n+p+q≈1.
REFERENCES:
patent: 4587138 (1986-05-01), Yau et al.
patent: 5010159 (1991-04-01), Bank et al.
patent: 5100503 (1992-03-01), Allman et al.
patent: 5210168 (1993-05-01), Bergstrom et al.
patent: 5422223 (1995-06-01), Sachdev et al.
patent: 5441765 (1995-08-01), Ballance et al.
patent: 5691396 (1997-11-01), Takemura et al.
patent: 5708099 (1998-01-01), Kushibiki et al.
patent: 5762697 (1998-06-01), Sakamoto et al.
patent: 5891529 (1999-04-01), Harkness et al.
patent: 6057239 (2000-05-01), Wang et al.
patent: 6087064 (2000-07-01), Lin et al.
patent: 6156640 (2000-12-01), Tsai et al.
patent: 6177143 (2001-01-01), Treadwell et al.
patent: 6268457 (2001-07-01), Kennedy et al.
patent: 6281285 (2001-08-01), Becker et al.
patent: 6329118 (2001-12-01), Hussein et al.
patent: 6340734 (2002-01-01), Lin et al.
patent: 6344284 (2002-02-01), Chou
patent: 6359096 (2002-03-01), Zhong et al.
patent: 6365765 (2002-04-01), Baldwin et al.
patent: 6368400 (2002-04-01), Baldwin et al.
patent: 6395397 (2002-05-01), Hong et al.
patent: 6420088 (2002-07-01), Angelopoulos et al.
patent: 6424039 (2002-07-01), Wang et al.
patent: 6461955 (2002-10-01), Tsu et al.
patent: 6503692 (2003-01-01), Angelopoulos et al.
patent: 6506497 (2003-01-01), Kennedy et al.
patent: 6515073 (2003-02-01), Sakamoto et al.
patent: 6576681 (2003-06-01), Zampini et al.
patent: 6589711 (2003-07-01), Subramanian et al.
patent: 6596405 (2003-07-01), Zampini et al.
patent: 6599951 (2003-07-01), Zampini et al.
patent: 6605362 (2003-08-01), Baldwin et al.
patent: 6730454 (2004-05-01), Pfeiffer et al.
patent: 6746530 (2004-06-01), Wang
patent: 6924346 (2005-08-01), Boisvert et al.
patent: 6982006 (2006-01-01), Boyers et al.
patent: 7368173 (2008-05-01), Zhong et al.
patent: 2001/0036998 (2001-11-01), Sakamoto et al.
patent: 2002/0025495 (2002-02-01), Ogata et al.
patent: 2002/0042020 (2002-04-01), Gallagher et al.
patent: 2002/0055000 (2002-05-01), Kennedy et al.
patent: 2002/0065331 (2002-05-01), Zampini et al.
patent: 2002/0095018 (2002-07-01), Baldwin et al.
patent: 2002/0128388 (2002-09-01), Kennedy et al.
patent: 2002/0187422 (2002-12-01), Angelopoulos et al.
patent: 2002/0195419 (2002-12-01), Pavelchek
patent: 2002/0198269 (2002-12-01), Zampini et al.
patent: 2003/0022953 (2003-01-01), Zampini et al.
patent: 2003/0120018 (2003-06-01), Baldwin et al.
patent: 2003/0199659 (2003-10-01), Baldwin et al.
patent: 2003/0209515 (2003-11-01), Pavelchek
patent: 2005/0282090 (2005-12-01), Hirayama et al.
patent: 2006/0021964 (2006-02-01), Hirayama et al.
patent: 2008/0241748 (2008-10-01), Motallebi et al.
patent: 2009/0280438 (2009-11-01), Kohno et al.
patent: 2009/0286179 (2009-11-01), Takeshita
patent: 1197511 (2002-04-01), None
patent: 1197998 (2002-04-01), None
patent: 06-56560 (1994-03-01), None
patent: WO 00/77575 (2000-12-01), None
patent: WO 02/06402 (2002-01-01), None
patent: WO 03/044077 (2003-05-01), None
patent: WO03/044078 (2003-05-01), None
patent: WO03/044079 (2003-05-01), None
patent: WO03/044600 (2003-05-01), None
patent: WO03/089992 (2003-10-01), None
patent: WO2004/007192 (2004-01-01), None
patent: WO2004/044025 (2004-05-01), None
patent: WO2004/046224 (2004-06-01), None
patent: WO2004/051376 (2004-06-01), None
patent: WO 2004/090965 (2004-10-01), None
patent: WO2004/113417 (2004-12-01), None
patent: WO 2006/065310 (2006-06-01), None
patent: WO 2006/065316 (2006-06-01), None
patent: WO 2006/065320 (2006-06-01), None
Schiavone et al., SiON based antireflective coating for 193nm lithography, Part of the SPIE Conference on Advances in Resist Technology and Processing XVI, SPIE vol. 3678, Mar. 1999, 391-395.
Kennedy et al., An Anthraacene-Organosiloxane Spin On Antireflective Coating for KrF Lithography. Advances in Resist Technology and Processing XX, Theodore H. Fedynshyn, Editor, Proceedings of SPIE vol. 5039, 2003, 144-151.
Kennedy et al., Organosiloxane based Bottom Antireflective Coatings for 193nm Lithography. Advances in Resist Technology and Processing XX. Theodore H. Fedynyshyn, Editor, Proceedings of SPIE vol. 5039, 2003, 929-939.
Fu Peng-Fei
Moyer Eric Scott
Yeakle Craig Rollin
Brady Sharon K.
Dow Corning Corporation
Zimmer Marc S
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