Method for forming an MOS transistor having a metallic gate elec

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438585, 438586, 438595, 438596, H01L 21336

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active

059602708

ABSTRACT:
A method for forming a metal gate MOS transistor begins by forming source and drain electrodes (26, 28, and/or 118) within a substrate (12 or 102). These source and drain regions (26, 28, and 118) are self-aligned to a lithographically-patterned feature (24 or 108). After formation of the source and drain regions, the features (24 and 108 are processed to fill these features with a metallic gate layer (28a or 128a). This metal layer (28a or 128a) is then chemically mechanically polished (CMPed) to form a metallic plug region (28b or 128b) within the features (24 or 108). The plug region (28b or 128b) is formed in either an inlaid or dual inlaid manner wherein this metallic plug region (28b or 128b) is self-aligned to the previously formed source and drain regions and preferably functions as a metal MOS gate region.

REFERENCES:
patent: 5391510 (1995-02-01), Hsu et al.
patent: 5393681 (1995-02-01), Witek et al.
patent: 5434093 (1995-07-01), Chau et al.
patent: 5447874 (1995-09-01), Grivna et al.
patent: 5716861 (1998-02-01), Moslehi

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