Method for forming a floating gate using chemical mechanical...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S201000, C438S211000, C438S258000, C438S259000, C438S261000, C257SE21422, C257SE21680, C257SE21687, C257SE21688

Reexamination Certificate

active

07998809

ABSTRACT:
An improved process forming a floating gate region of a semiconductor memory device. The process includes using a ceria slurry for chemical mechanical planarization to provide “stop on polysilicon” capabilities, allowing a thin nitride layer, or in the alternative no nitride layer, to be used and reducing the number of processing steps required to form the floating gate region.

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