Method for forming a dielectric layer and related devices

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Multiple layers

Reexamination Certificate

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C438S775000, C438S785000, C438S786000, C438S791000

Reexamination Certificate

active

07101811

ABSTRACT:
A dielectric layer may be formed by depositing the dielectric layer to an intermediate thickness and applying a nitridation process to the dielectric layer of intermediate thickness. The dielectric layer may then be deposited to the final, desired thickness.

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