Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Multiple layers
Reexamination Certificate
2006-09-05
2006-09-05
Quach, T. N. (Department: 2826)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Multiple layers
C438S775000, C438S785000, C438S786000, C438S791000
Reexamination Certificate
active
07101811
ABSTRACT:
A dielectric layer may be formed by depositing the dielectric layer to an intermediate thickness and applying a nitridation process to the dielectric layer of intermediate thickness. The dielectric layer may then be deposited to the final, desired thickness.
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Kuse Ronald John
Yasuda Tetsuji
Blakely , Sokoloff, Taylor & Zafman LLP
Intel Corporation
Quach T. N.
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