Method for forming a capacitor for an integrated circuit and...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S255000, C257SE21396

Reexamination Certificate

active

10891051

ABSTRACT:
Integrated circuits can include an integrated capacitor with a metal alloy layer. Methods for forming such integrated circuits can include providing a substrate, forming a first electrode including depositing a metal alloy layer having a first surface and an exposed second surface, etching the exposed second surface of the metal alloy layer thereby increasing the surface roughness of the second surface of the metal alloy layer, forming a capacitor dielectric on the first electrode and forming a second electrode on the capacitor dielectric. By providing a metal alloy layer and etching the second surface of the metal alloy layer, an increased capacitance of the integrated capacitor is achieved.

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patent: 6448131 (2002-09-01), Cabral et al.
patent: 2004/0040863 (2004-03-01), Lee et al.
patent: 2004/0185636 (2004-09-01), Marsh
patent: 1 298 716 (2003-04-01), None

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