Method for fabricating vertical channel type nonvolatile...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S268000, C438S269000, C257S296000, C257S302000

Reexamination Certificate

active

08048743

ABSTRACT:
A method for fabricating a vertical channel type nonvolatile memory device includes: stacking a plurality of interlayer insulating layers and a plurality of gate electrode conductive layers alternately over a substrate; etching the interlayer insulating layers and the gate electrode conductive layers to form a channel trench exposing the substrate; forming an undoped first channel layer over the resulting structure including the channel trench; doping the first channel layer with impurities through a plasma doping process; and filling the channel trench with a second channel layer.

REFERENCES:
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patent: 2004/0229415 (2004-11-01), Takehashi et al.
patent: 2009/0184360 (2009-07-01), Jin et al.
patent: 54008981 (1979-01-01), None
patent: 2008-192708 (2008-08-01), None
patent: 1020070046350 (2007-05-01), None
patent: 102007006991 (2007-07-01), None
Notice of Preliminary Rejection issued from Korean Intellectual Property Office on Apr. 12, 2011.

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