Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2008-01-01
2008-01-01
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S259000, C438S270000, C438S274000, C438S297000, C438S298000, C438S362000, C438S370000, C438S423000, C438S700000, C438S425000, C257SE21429, C257SE21166, C257SE21548, C257SE21555, C257SE21553
Reexamination Certificate
active
07314792
ABSTRACT:
A method for fabricating a transistor of a semiconductor device is provided. The method includes: forming device isolation layers in a substrate including a bottom structure, thereby defining an active region; etching the active region to a predetermined depth to form a plurality of recess structures each of which has a flat bottom portion with a critical dimension (CD) larger than that of a top portion; and sequentially forming a gate oxide layer and a metal layer on the recess structures; and patterning the gate oxide layer and the metal layer to form a plurality of gate structures.
REFERENCES:
patent: 6376383 (2002-04-01), Mitsuiki
patent: 2004/0124492 (2004-07-01), Matsuo
patent: 2004/0248348 (2004-12-01), Rausch et al.
patent: 2005/0001252 (2005-01-01), Kim et al.
patent: 1224234 (2003-06-01), None
patent: 103 61 695 (2005-02-01), None
patent: 05-251471 (1993-09-01), None
patent: 10-1998-52470 (2003-01-01), None
patent: 10-2004-0104290 (2004-12-01), None
patent: 556323 (2003-10-01), None
Notice of Search Report from the Taiwanese Patent Office, dated Jan. 28, 2007, in counterpart Taiwanese Patent Application No. 94143167.
Notice of Preliminary Rejection from the Korean Intellectual Property Office, dated Nov. 20, 2006, in counterpart Korean Patent Application No. 2005-36184.
First Office Action from the State Intellectual Property Office of the People's Republic of China dated Aug. 17, 2007 in counterpart Chinese patent application No. 200510135164.6.
Jang Sea-Ug
Jung Tae-Woo
Kim Myung-Ok
Lee Sung-Kwon
Ahmadi Mohsen
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Hynix / Semiconductor Inc.
Lebentritt Michael
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