Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2008-10-28
2010-12-14
Mai, Anh D (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S296000, C438S589000, C257SE21429
Reexamination Certificate
active
07851298
ABSTRACT:
Provided is a method for fabricating a transistor in a semiconductor device. The method includes forming an etch stop layer pattern over a semiconductor substrate; forming a semiconductor layer for covering the etch stop layer pattern; forming a recess trench that exposes an upper surface of the etch stop layer pattern by etching the semiconductor layer pattern; removing the etch stop layer pattern exposed in the recess trench; and forming a gate that fills the recess trench.
REFERENCES:
patent: 5861331 (1999-01-01), Chien
patent: 2007/0259499 (2007-11-01), Eun et al.
patent: 2008/0150021 (2008-06-01), Koops et al.
patent: 2008/0203483 (2008-08-01), Kuroki
patent: 10-2005-0004352 (2005-01-01), None
patent: 10-0713001 (2007-04-01), None
patent: 10-2008-0087518 (2008-10-01), None
Eun Yong Seok
Kim Su Ho
Lee An Bae
Seo Hye Jin
Hynix / Semiconductor Inc.
Mai Anh D
Marshall & Gerstein & Borun LLP
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