Method for fabricating storage electrode of semiconductor...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S396000, C438S584000, C257SE21209

Reexamination Certificate

active

11147249

ABSTRACT:
The present invention discloses improved method for manufacturing semiconductor device wherein a barrier layer is formed by thermally treating a hard mask polysilicon layer for protecting the sacrificial oxide film and the hard mask polysilicon film from damages.

REFERENCES:
patent: 5352623 (1994-10-01), Kamiyama
patent: 5661056 (1997-08-01), Takeuchi
patent: 5747357 (1998-05-01), Su
patent: 6509244 (2003-01-01), Kim et al.
patent: 6562679 (2003-05-01), Lee et al.
patent: 2000-7541 (2000-02-01), None
patent: 2003-49942 (2003-06-01), None

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