Method for fabricating semiconductor nanocrystal and semiconduct

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438263, 438264, 117935, 117936, 117 87, H01L 21336

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active

060906669

ABSTRACT:
There are provided a method for fabricating semiconductor nanocrystals which are highly controllable and less variable in density and size, as well as a semiconductor memory device which, with the use of the semiconductor nanocrystals, allows thickness of a insulating film between nanocrystals and channel region to be easily controlled and involves less variations in characteristics such as threshold and programming performance, and which is fast reprogrammable and has nonvolatility. Under a low pressure below atmospheric pressure, an amorphous silicon thin film 3 is deposited on a tunnel insulating film 2 formed on a silicon substrate 1. After the deposition of the amorphous silicon thin film 3, the amorphous silicon thin film 3 is heat treated at a temperature not lower than the deposition temperature of the amorphous silicon thin film 3 in an atmosphere of helium gas having no oxidizability, by which a plurality of spherical nanocrystals 4 with a diameter of 18 nm or less are formed on the tunnel insulating film 2 so as to be spaced from one another. The plurality of nanocrystals 4 are used as the floating gate of a semiconductor memory device.

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Tiwari et al, "A Silicon Nanocrystals Based Memory", Appl. Phys. Lett. 68 (10), Mar. 4, 1996, American Institute of Physics, pp. 1377-1379.
Hanafi, et al, "Fast and Long Retention-Time Non-Crystal Memory", IEEE Transactions on Electron Devices, vol. 43, No. 9, Sep. 1996, pp. 1553-1558 .

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