Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2004-12-21
2008-03-04
Lee, Hsien-Ming (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S301000, C438S305000, C438S306000, C257SE21641
Reexamination Certificate
active
07338871
ABSTRACT:
The present invention provides a method for fabricating a semiconductor device capable of preventing a contact resistance from increasing in a region contacted to an N-type conductive region during forming a conductive pattern directly contacted to the N-type conductive region including a conductive pattern and silicon, and preventing an increase in a parasitic capacity of the conductive pattern according to an increase in a thickness of a barrier layer.
REFERENCES:
patent: 6271132 (2001-08-01), Xiang et al.
patent: 6376368 (2002-04-01), Jung et al.
patent: 6440828 (2002-08-01), Sato et al.
patent: 6528835 (2003-03-01), Kaeriyama
patent: 6645806 (2003-11-01), Roberts
patent: 6790723 (2004-09-01), Tanaka et al.
patent: 6864506 (2005-03-01), Kim et al.
patent: 2002/0024119 (2002-02-01), Tanaka et al.
patent: 2005/0239287 (2005-10-01), Wang et al.
patent: 10-2005-0009354 (2005-01-01), None
Kim Jun-Ki
Lee Joo-Wan
Blakely & Sokoloff, Taylor & Zafman
Hynix / Semiconductor Inc.
Lee Hsien-Ming
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