Method for fabricating semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S200000, C438S216000, C438S257000, C438S266000

Reexamination Certificate

active

11527459

ABSTRACT:
In a method for fabricating a semiconductor device in which a semiconductor memory element having an ONO film and a CMOS part are formed on a single semiconductor substrate, a CMOS gate-oxidation step is performed several times. Thereafter, a bit line diffusion layer and a bit line oxide film are formed in the semiconductor memory element.

REFERENCES:
patent: 6927450 (2005-08-01), Nishizaka et al.
patent: 2002/0016081 (2002-02-01), Aloni et al.
patent: 2002-110821 (2000-09-01), None
patent: 2001-077220 (2001-03-01), None
patent: 2001-351987 (2001-12-01), None
patent: 2002-246486 (2002-08-01), None
patent: 2003-086716 (2003-03-01), None
patent: 2003-282743 (2003-03-01), None

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