Method for fabricating semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S399000, C438S238000, C438S397000, C438S253000, C438S254000, C438S255000, C438S256000, C438S381000, C438S396000, C438S398000

Reexamination Certificate

active

07029970

ABSTRACT:
A method for fabricating a semiconductor device capable of preventing an electric short between lower electrodes caused by leaning lower electrodes, or lifted lower electrodes and of securing a sufficient capacitance of a capacitor by increasing an effective capacitor area. The method includes the steps of: preparing a semi-finished semiconductor substrate; forming a sacrificial layer on the semi-finished semiconductor substrate; patterning the sacrificial layer by using an island-type photoresist pattern, thereby obtaining at least one contact hole to expose portions of the semi-finished semiconductor substrate; and forming a conductive layer on the sacrificial layer.

REFERENCES:
patent: 5759914 (1998-06-01), Park
patent: 6235578 (2001-05-01), Brown
patent: 6381165 (2002-04-01), Lee et al.
patent: 6800522 (2004-10-01), Lee
patent: 2003/0003654 (2003-01-01), Brown
patent: 2003/0048593 (2003-03-01), Hong
patent: 2003/0215983 (2003-11-01), Bae et al.
patent: 2004/0067623 (2004-04-01), Chuang
patent: 2005/0095782 (2005-05-01), Park

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