Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-04-03
2007-04-03
Pham, Thanhha (Department: 2813)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S138000, C438S156000
Reexamination Certificate
active
10906166
ABSTRACT:
A method for fabricating a power MOSFET, comprising an epitaxial layer, a gate dielectric layer and a gate layer formed on a substrate, the gate dielectric layer and the gate layer defined to form a gate structure, a stacked mask and the surface of the epitaxial layer partially exposed between the gate structure and the stacked mask, a well region formed in the epitaxial layer and partially under the gate structure and the stacked mask, a source region is formed in the well region between the gate structure and the stacked mask, a patterned dielectric layer exposing the top of the stacked mask formed over the substrate, the stacked mask removed to form a contact opening exposing the surface of the well region partially and a body region formed in the well region under the contact opening.
REFERENCES:
patent: 6049104 (2000-04-01), Hshieh et al.
patent: 6153451 (2000-11-01), Hutter et al.
patent: 6165821 (2000-12-01), Boden et al.
patent: 6773977 (2004-08-01), Reynes et al.
Episil Technologies Inc.
Jianq Chyun IP Office
Pham Thanhha
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