Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-05-02
2008-10-21
Thai, Luan (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S316000, C257S382000, C257SE29300
Reexamination Certificate
active
07439571
ABSTRACT:
Methods of forming a microelectronic structure are described. Those methods comprise providing a substrate comprising source/drain and gate regions, wherein the gate region comprises a metal layer disposed on a gate dielectric layer, and then laser annealing the substrate.
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Pending U.S. Appl. No. 10/748,345, filed Dec. 29, 2003; inventor: Doczy Office Action dated Nov. 30, 2006.
Brask Justin K.
Chau Robert S.
Doczy Mark L.
Kavalieros Jack
Liu Mark Y.
Intel Corporation
Ortiz Kathy J.
Thai Luan
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