Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-06-13
2006-06-13
Kebede, Brooke (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
Reexamination Certificate
active
07060561
ABSTRACT:
The present invention relates to a method for fabricating a memory device. According to this invention, because the trenches for the isolation structures are etched simultaneously as patterning the first conductive layer and the first dielectric layer, the formed isolation structures are self-aligned with the stacked gate structures, thus increasing the reliability for the memory device by avoiding misalignment problems.
REFERENCES:
patent: 6342715 (2002-01-01), Shimizu et al.
patent: 6667507 (2003-12-01), Shirota et al.
patent: 2003/0197234 (2003-10-01), Farrar
J.C. Patents
Kebede Brooke
United Microelectronics Corp.
LandOfFree
Method for fabricating memory device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for fabricating memory device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for fabricating memory device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3615462