Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Physical stress responsive
Reexamination Certificate
2005-04-22
2009-11-17
Lee, Hsien-ming (Department: 2823)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Physical stress responsive
C438S055000, C257SE23001
Reexamination Certificate
active
07618837
ABSTRACT:
The invention discloses a novel flexible, modular fabrication method for integrated high aspect ratio single crystal silicon microstructures designed and manufactured in a post conventional CMOS process (Post-CMOS). The method involves the standard circuits formation, the electrical isolation trenched etching and refilling, backside etching, interconnection formation, and structure releasing. Further, a method of tailoring the trench profile for refill the trench fully without void is also disclosed.
REFERENCES:
patent: 6121552 (2000-09-01), Brosnihan et al.
patent: 6180480 (2001-01-01), Economikos et al.
patent: 6291875 (2001-09-01), Clark et al.
patent: 6551849 (2003-04-01), Kenney
patent: 6972471 (2005-12-01), Yang et al.
patent: 2004/0082140 (2004-04-01), Yang et al.
patent: 2005/0109081 (2005-05-01), Zribi et al.
patent: WO-2004/044958 (2004-05-01), None
Fan Jie
Liu Xuesong
Wang Yangyuan
Yan Guizhen
Zhou Jian
Austin Rapp & Hardman
Lee Hsien-ming
Peking University
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