Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-12-26
2006-12-26
Coleman, W. David (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
Reexamination Certificate
active
07153742
ABSTRACT:
A flash memory device fabrication method is disclosed. A disclosed method comprises: forming an oxide layer on a substrate; depositing a first polysilicon on the entire surface of the oxide layer and patterning the first polysilicon; depositing an insulating layer on the entire surface of the first polysilicon and patterning the insulating layer to expose the first polysilicon; depositing a second polysilicon on the entire surface of the resulting structure and patterning the second polysilicon; removing the insulating layer; depositing a dielectric layer on the entire surface of the resulting structure; and depositing a third polysilicon on the entire surface of the dielectric layer.
REFERENCES:
patent: 5756384 (1998-05-01), Tseng
patent: 6130129 (2000-10-01), Chen
patent: 6635532 (2003-10-01), Song et al.
patent: 6670239 (2003-12-01), Yoon
patent: 6768681 (2004-07-01), Kim
patent: 2003/0080373 (2003-05-01), Lee
patent: 2003/0219944 (2003-11-01), Kato et al.
Coleman W. David
Dongbu Electronics Co. Ltd.
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
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