Method for fabricating flash memory cells

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438286, H01L 218247

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active

058997180

ABSTRACT:
A method for fabricating flash memory cells having a DDD structure that prevents leakage current during data erasure, that does not require a high temperature drive-in process, and that easily combines with other logic processes. The method for fabricating the flash memory cells utilizes ion implantation through contact windows to establish heavily doped source and drain regions inside previously formed deeply doped source and drain regions to construct the DDD structure.

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