Etching a substrate: processes – Gas phase etching of substrate – Application of energy to the gaseous etchant or to the...
Reexamination Certificate
2007-04-30
2009-02-24
Tran, Binh X (Department: 1792)
Etching a substrate: processes
Gas phase etching of substrate
Application of energy to the gaseous etchant or to the...
C216S072000, C216S079000, C438S725000
Reexamination Certificate
active
07494599
ABSTRACT:
A method for forming a fine pattern in a semiconductor device includes forming a first polymer layer over an etch target layer, the first polymer layer including a carbon-rich polymer layer, forming a second polymer layer over the first polymer layer, the second polymer layer including a silicon-rich polymer layer, patterning the second polymer layer, oxidizing surfaces of the patterned second polymer layer, etching the first polymer layer using the patterned second polymer layer comprising the oxidized surfaces, and etching the etch target layer using the patterned second polymer layer comprising the oxidized surfaces and the etched first polymer layer.
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Kim Won-Kyu
Lee Sung-Kwon
Moon Seung-Chan
Hynix / Semiconductor Inc.
Townsend and Townsend / and Crew LLP
Tran Binh X
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