Method for fabricating CMOS image sensor with plasma...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C257S292000

Reexamination Certificate

active

07629216

ABSTRACT:
A method for fabricating a complementary metal-oxide semiconductor (CMOS) image sensor includes providing a semi-finished substrate, forming a patterned blocking layer over a photodiode region of the substrate, implanting impurities on regions other than the photodiode region using a mask while the patterned blocking layer remains, and removing the mask.

REFERENCES:
patent: 6974715 (2005-12-01), Lee
patent: 7381584 (2008-06-01), Lim
patent: 2005/0059177 (2005-03-01), Rhodes
patent: 2007/0007611 (2007-01-01), Park et al.
patent: 2007/0020796 (2007-01-01), Park
patent: 2005-72236 (2005-03-01), None
patent: 20020017747 (2002-03-01), None
patent: 20040058708 (2004-07-01), None
patent: 20040058733 (2004-07-01), None
patent: 20060077115 (2006-07-01), None

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