Method for fabricating capacitor of semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438386, 438424, H01L 218242

Patent

active

057535493

ABSTRACT:
A method for fabricating a capacitor of a semiconductor device which is capable of reducing data errors caused due to the interaction between neighboring capacitors, which includes the steps of forming a first trench in a semiconductor substrate, filling the first trench with an insulation film, etching the semiconductor substrate at both sides of the first trench for forming second and third trenches, forming a first electrode at both sides of the second and third trenches, respectively, forming a dielectric film on the first electrode and the second and third trenches, and forming a second electrode on the dielectric film.

REFERENCES:
patent: 4577395 (1986-03-01), Shibata
patent: 5106774 (1992-04-01), Hieda et al.
patent: 5272102 (1993-12-01), Hur et al.
patent: 5346845 (1994-09-01), Jun
patent: 5466628 (1995-11-01), Lee et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for fabricating capacitor of semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for fabricating capacitor of semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for fabricating capacitor of semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1852605

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.