Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-05-02
2006-05-02
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
Reexamination Certificate
active
07037778
ABSTRACT:
Disclosed is a method for fabricating a capacitor in a semiconductor memory device. The method includes the steps of: sequentially forming a first insulation layer and a first etch stop layer on a substrate; forming a plurality of contact holes by etching the first insulation layer and the first etch stop layer; forming a plurality of contact plugs on the plurality of contact holes such that the contact plugs are more projected than the first etch stop layer; sequentially forming a second etch stop layer and a capacitor insulation layer; forming a plurality of openings by etching the second etch stop layer and the capacitor insulation layer to expose the contact plugs; sequentially forming a storage node material and a sacrificial layer; etching the storage node material and the sacrificial layer, thereby obtaining isolated storage node material; and removing remaining portions of the sacrificial layer and the capacitor insulation layer.
REFERENCES:
patent: 6667209 (2003-12-01), Won et al.
patent: 6716679 (2004-04-01), Bae
patent: 6800522 (2004-10-01), Lee
Hynix / Semiconductor Inc.
Lebentritt Michael
Stevenson André
Townsend and Townsend / and Crew LLP
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