Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-03-13
2007-03-13
Nguyen, Tuan H. (Department: 2813)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S386000
Reexamination Certificate
active
10886053
ABSTRACT:
A method for fabricating a trench structure, in particular a trench capacitor with an insulation collar, which is electrically connected to a substrate on one side via a buried contact. Fabrication includes, for example, providing a trench in the substrate using a hard mask with a corresponding mask opening; providing an at least partial trench filling; providing a liner on the resulting structure; carrying out an oblique implantation of impurity ions onto the liner for altering the etching properties of an implanted partial region of the liner; selectively removing the implanted partial region of the liner by a first etching for forming a liner mask from the complimentary partial region of the liner, which partially masks the top side of the trench filling; removing a part of the trench filling by a second etching using the liner mask; and replacing the removed part of the trench filling.
REFERENCES:
patent: 4157269 (1979-06-01), Ning et al.
patent: 6426253 (2002-07-01), Tews et al.
patent: 6498061 (2002-12-01), Divakaruni et al.
patent: 6936512 (2005-08-01), Chudzik et al.
patent: 2005/0191564 (2005-09-01), Huang et al.
Kieslich Albrecht
Kudelka Stephan
Pears Kevin
Morrison & Foerster / LLP
Nguyen Tuan H.
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