Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2011-07-12
2011-07-12
Pham, Thanh V (Department: 2894)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S232000, C438S289000, C257S335000, C257SE21435
Reexamination Certificate
active
07977197
ABSTRACT:
A transistor and a method for the fabrication of transistors with different gate oxide thicknesses is proposed, in which for the doping of the source, the typical LDD implantation, which is formed after the fabrication of the gate electrode, is replaced by a doping step, which is generated before applying the gate stack. In this way that is already a component of the remaining process sequence in the fabrication of the transistor doping can be used.
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Taur, Yuan et al., “Fundamentals of Modern VLSI Devices”, Cambridge University Press, 1998 (248 pages).
Knaipp Martin
Röhrer Georg
austriamicrosystems AG
Cohen Pontani Lieberman & Pavane LLP
Muñoz Andrés
Pham Thanh V
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