Method for fabricating a nonvolatile memory cell

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21179

Reexamination Certificate

active

11735440

ABSTRACT:
A method of fabricating a nonvolatile memory cell includes providing a substrate with a trench, with a sidewall where a tunnel oxide layer and a floating gate are successively formed, forming a control gate in the trench, performing a high density plasma deposition process to form an HDP oxide layer on the top surface of control gate.

REFERENCES:
patent: 5110753 (1992-05-01), Gill et al.
patent: 2004/0188751 (2004-09-01), Lin
patent: 2007/0059898 (2007-03-01), Shin et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for fabricating a nonvolatile memory cell does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for fabricating a nonvolatile memory cell, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for fabricating a nonvolatile memory cell will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3861349

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.