Method for fabricating a metal field effect transistor having a

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438298, 438303, 438307, 438291, H01L 21265, H01L 2144, H01L 21255, H01L 21302

Patent

active

056209118

ABSTRACT:
A method for fabricating a metal oxide semiconductor field effect transistor, capable of achieving a reduction in topology by forming a trench on a silicon substrate by use of a temporary field oxide film and forming a gate electrode in the trench and capable of eliminating occurrence of a spiking phenomenon due to a metal wiring being in direct contact with the silicon substrate by forming a silicide film on a source and a drain, and capable of obtaining an increased contact margin of the metal wiring by overlapping the silicide film with a field oxide film formed on the silicon substrate.

REFERENCES:
patent: 4271421 (1981-06-01), McElroy
patent: 4685196 (1987-08-01), Lee
patent: 4939100 (1990-07-01), Jeuch et al.
patent: 5108937 (1992-04-01), Tsai et al.
patent: 5169796 (1992-12-01), Murray et al.
patent: 5198378 (1993-03-01), Rodder et al.
patent: 5248893 (1993-09-01), Sakamoto
patent: 5342796 (1994-08-01), Ahn et al.
patent: 5434440 (1995-07-01), Yoshitomi et al.
patent: 5448094 (1995-09-01), Hsu

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for fabricating a metal field effect transistor having a does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for fabricating a metal field effect transistor having a , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for fabricating a metal field effect transistor having a will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-360456

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.