Method for enhancing the nucleation and morphology of...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S686000

Reexamination Certificate

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10868384

ABSTRACT:
Methods for depositing a ruthenium metal layer on a dielectric substrate are provided. The methods involve, for instance, exposing the dielectric substrate to an amine-containing compound, followed by exposing the substrate to a ruthenium precursor and an optional co-reactant such that the amine-containing compound facilitates the nucleation on the dielectric surface.

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patent: 6417115 (2002-07-01), McDevitt et al.
patent: 6989599 (2006-01-01), Iwasaki et al.
patent: 2001/0043453 (2001-11-01), Narwankar et al.
patent: 2004/0214354 (2004-10-01), Marsh et al.
patent: 2005/0118807 (2005-06-01), Kim et al.
patent: 2006/0093848 (2006-05-01), Senkevich et al.
U.S. Appl. No. 10/772,109, entitled “Use of Metallocenes to Inhibit Copper Oxidation during Semiconductor Processing”, by Dalton et al., filed on Feb. 3, 2004.

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