Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2005-11-01
2005-11-01
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
C324S765010
Reexamination Certificate
active
06960908
ABSTRACT:
An electrical testing method for a semiconductor package for detecting defects of sockets mounted on a device under test (DUT) board is provided. A tester performs electrical test, accumulates electrical test results, and compares the accumulated results to reference values. The result of the comparison decides whether a plurality of sockets mounted on the DUT board can be used or not. The decision results are transmitted to a handler so that the socket having the defects is not used on the DUT board.
REFERENCES:
patent: 4924179 (1990-05-01), Sherman
patent: 5283605 (1994-02-01), Lang-Dahlke
patent: 5436570 (1995-07-01), Tan
patent: 5621312 (1997-04-01), Achor et al.
patent: 5907247 (1999-05-01), Vogley
patent: 6323666 (2001-11-01), Ohba
patent: 2000193718 (2000-07-01), None
patent: 10-0269942 (2000-07-01), None
patent: 1020020077598 (2002-10-01), None
patent: 10-0372881 (2003-02-01), None
English language abstract of Korean Registration No. 10-0372881.
English language abstract of Korean Registration No. 10-0269942.
English language abstract of Japanese Publication No. JP2000193718.
English language abstract of Korean Publication No. 1020020077598.
Bang Jeong-ho
Chi Dae-gab
Chung Ae-yong
Kim Sung-ok
Shin Kyeong-seon
Marger & Johnson & McCollom, P.C.
Nguyen Vinh P.
Samsung Electronics Co,. Ltd.
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