Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Electron beam imaging
Patent
1996-10-24
1997-10-14
Duda, Kathleen
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Electron beam imaging
430330, 430942, 2504922, G03F 738
Patent
active
056771096
ABSTRACT:
A method for writing on a semiconductor wafer using electron beams is provided. One embodiment of the method includes the steps of using electron beams to irradiate a semiconductor substrate on which a resist layer has been formed, to thereby draw patterns on the resist layer, and then baking the resist layer and substrate in a vacuum.
REFERENCES:
patent: 4348473 (1982-09-01), Okumura
patent: 5106455 (1992-04-01), Jacobsen
patent: 5127987 (1992-07-01), Okudaira
Morikawa Junko
Nozue Hiroshi
Yamashita Hiroshi
Duda Kathleen
NEC Corporation
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