Method for E-beam writing

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Electron beam imaging

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Details

430330, 430942, 2504922, G03F 738

Patent

active

056771096

ABSTRACT:
A method for writing on a semiconductor wafer using electron beams is provided. One embodiment of the method includes the steps of using electron beams to irradiate a semiconductor substrate on which a resist layer has been formed, to thereby draw patterns on the resist layer, and then baking the resist layer and substrate in a vacuum.

REFERENCES:
patent: 4348473 (1982-09-01), Okumura
patent: 5106455 (1992-04-01), Jacobsen
patent: 5127987 (1992-07-01), Okudaira

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