Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2011-06-28
2011-06-28
Hoang, Huan (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185170, C365S185180
Reexamination Certificate
active
07969789
ABSTRACT:
In a nonvolatile semiconductor memory device having n (n is an integer of two or more) electrode films stacked and having charge storage layers provided above and below each of the electrode films, when data “0” is written by injecting electrons into the charge storage layer on a source line side of a memory cell of the number k (k is an integer of 1 to (n−1)) as counted from an end on a bit line side in a selected semiconductor pillar, positive program potential is given to the electrode film of the number 1 to k as counted from the bit line side, and 0 V is given to the electrode film of the number (k+1) to n, therewith positive potential is given to the bit line and 0 V is given to the source line.
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Aochi Hideaki
Fukuzumi Yoshiaki
Ishiduki Megumi
Katsumata Ryota
Kidoh Masaru
Hoang Huan
Kabushiki Kaisha Toshiba
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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