4. Communications: electrical
  5. Continuously variable indicating
  6. With meter reading

Ryota Katsumata

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Double-gate structure fin-type transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Measurement system and measurement method

Semiconductor device manufacturing: process – Including control responsive to sensed condition – Optical characteristic sensed
Patent

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Method for driving nonvolatile semiconductor memory device

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Method for manufacturing a nonvolatile semiconductor storage...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Non-volatile semiconductor storage device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Profile ID: LFUS-PAI-P-404759

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