Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – By reaction with substrate
Reexamination Certificate
2005-08-30
2005-08-30
Thompson, Craig A. (Department: 2813)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
By reaction with substrate
Reexamination Certificate
active
06936548
ABSTRACT:
A method for producing silicon nitride and silicon oxynitride films by CVD technology, where even at lower temperatures, acceptable film-deposition rates are achieved, without the by-product production of large amounts of ammonium chloride.
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International Search Report for PCT/EP02/13869.
Dussarrat Christian
Girard Jean-Marc
Harrison Monica D.
L'Air Liquide, Societe Anonyme pour l'etude et, l'Exploitation d
Russell Linda K.
Thompson Craig A.
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