Method for constructing Shmoo plots for SRAMs

Details Method for constructing Shmoo plots for SRAMs Method for constructing Shmoo plots for SRAMs

2009-03-10

2010-10-26

Phung, Anh (Department: 2824)

Static information storage and retrieval

Systems using particular element

Flip-flop

C365S189090, C365S189140, C365S203000

Reexamination Certificate

active

07821816

ABSTRACT:
A method of preparing Shmoo plots where both the number of failures and also the failure type is specified at each test voltage measurement point. A method that uses the operational SRAM array circuitry to determine the type of failure that may have occurred at each test voltage measurement point.

REFERENCES:
patent: 7626851 (2009-12-01), Behrends et al.
Xiaowei Deng et al., Structure and Methods for Measuring Margins in an SRAM bit, U.S. Utility Patent Application, filed Feb. 18, 2009, U.S. Appl. No. 12/388,439.

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