Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-11-08
2008-12-09
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
07464347
ABSTRACT:
This invention is a toolset upgrading the basic WEBS system update that facilitates tracking design bugs. This invention provides an effective means for reporting, tracking, and eliminating design bugs in an environment of collaborating projects employing re-useable design hardware modules. This invention provides web-based bug reports and uses a tracking program with a SQL database to store all bugs. This invention allows bug reports sharing, alerting and tracking between many different projects.
REFERENCES:
patent: 6594799 (2003-07-01), Robertson et al.
patent: 7299446 (2007-11-01), He et al.
patent: 2006/0190903 (2006-08-01), Koo
Ngoh Francis C.
Tolia Jayesh K.
Brady W. James
Chiang Jack
Dimyan Magid Y
Marshall, Jr. Robert D.
Telecky , Jr. Frederick J.
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