Etching a substrate: processes – Gas phase etching of substrate – With measuring – testing – or inspecting
Reexamination Certificate
2005-04-19
2008-08-19
Olsen, Allan (Department: 1792)
Etching a substrate: processes
Gas phase etching of substrate
With measuring, testing, or inspecting
C438S714000, C438S729000
Reexamination Certificate
active
07413673
ABSTRACT:
An apparatus and method for adjusting the voltage applied to a Faraday shield of an inductively coupled plasma etching apparatus is provided. An appropriate voltage is easily and variably applied to a Faraday shield such that sputtering of a plasma can be controlled to prevent and mitigate deposition of non-volatile reaction products that adversely affect an etching process. The appropriate voltage for a particular etching process or step is applied to the Faraday shield by simply adjusting a tuning capacitor. It is not necessary to mechanically reconfigure the etching apparatus to adjust the Faraday shield voltage.
REFERENCES:
patent: 6422173 (2002-07-01), Nakajima
Bailey III Andrew D.
Kuthi Andras
Lohokare Shrikant P.
Lam Research Corporation
Martine & Penilla & Gencarella LLP
Olsen Allan
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