Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2005-11-03
2008-03-25
Louis-Jacques, Jacques (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S729000, C714S731000
Reexamination Certificate
active
07350122
ABSTRACT:
A method, apparatus and computer program product are provided for implementing scan-chain-specific control signals as an integral part of a scan chain. A scan input vector including scan data input and a scan control signal is applied to a register latch that forms the scan chain. The register latch includes a logic gate for combining a global clock control (THOLD) signal and the scan control signal. The scan control signal is routed around the register latch and including in a scan output vector including scan data output. Chain-specific control signals are eliminated from a clock control signal distribution tree used with the scan chain of the invention.
REFERENCES:
patent: 6779143 (2004-08-01), Grisenthwaite
patent: 2004/0148554 (2004-07-01), Dervisoglu et al.
Fredrickson Mark S.
Frei Scott Douglas
Jones Steven Paul
Louis-Jacques Jacques
Pennington Joan
Tabone, Jr. John J.
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