Method and system of modifying data in functional latches of...

Details Method and system of modifying data in functional latches of... Method and system of modifying data in functional latches of...

2006-12-05

2006-12-05

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07146551

ABSTRACT:
A method of modifying data of functional latches of a logic unit during scan chain testing thereof to verify a test case failure of a suspected cell comprises: (a) determining a test case failure in the logic unit through scan chain testing thereof; (b) suspending clocked operations of the logic unit; (c) during suspended clocked operations of the logic unit, performing the following steps: (i) reading logic states of the functional latches; and (ii) modifying the logic state of at least one of the functional latches based on the determined test case failure; (d) restarting clocked operations of the logic unit; and (e) reading logic states of the functional latches resulting from the modification to verify the test case failure of a suspected cell.

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