Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2007-09-21
2010-06-08
Luu, Pho M. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S191000, C365S200000
Reexamination Certificate
active
07733719
ABSTRACT:
A method of analyzing a failure in a semiconductor integrated circuit device may including storing defects and analog characteristics correlated with the defects in a database, detecting a fail bit in a first wafer, measuring analog characteristics of the fail bit in the first wafer, and identifying which defect has caused the fail bit by comparing the measured analog characteristics with the stored analog characteristics.
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* KR 1998-070482 corresponds with US 6,091,249.
Harness & Dickey & Pierce P.L.C.
Luu Pho M.
Samsung Electronics Co,. Ltd.
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