Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2011-04-19
2011-04-19
Ton, David (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S719000
Reexamination Certificate
active
07930602
ABSTRACT:
A method for performing a double pass nthfail bitmap of a memory array of a device under test includes a memory built-in test (MBIST) unit reading previously written data from each location of the memory array during a first pass, and detecting a failure associated with a mismatch between written and read data at each location. The method also includes storing within a storage, an address corresponding to a current failing location in response to determining that a predetermined number of locations have failed. The method further includes the MBIST unit reading the previously written data from each location during a second pass. The method includes locking and providing for output, read data stored at a current read address in response to a match between the current read address and any address stored within the storage.
REFERENCES:
patent: 6532182 (2003-03-01), Ogawa et al.
patent: 6550023 (2003-04-01), Brauch et al.
patent: 6643807 (2003-11-01), Heaslip et al.
patent: 6971055 (2005-11-01), Hung et al.
patent: 7051253 (2006-05-01), Rooney et al.
patent: 7181643 (2007-02-01), Kaiser et al.
patent: 2006/0028891 (2006-02-01), Selva et al.
patent: 2006/0248414 (2006-11-01), Dubey
Curran Stephen J.
Globalfoundries Inc.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Ton David
LandOfFree
Method and system for performing a double pass NTH fail... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for performing a double pass NTH fail..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for performing a double pass NTH fail... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2683925