Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2006-02-07
2006-02-07
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C374S178000
Reexamination Certificate
active
06996491
ABSTRACT:
A system and method are provided for sensing a physical stimulus of an integrated circuit. The system and method operate with one or more active thermal sensors embedded in the die of an integrated circuit to provide highly accurate die temperature measurements. The system and method are able to monitor and control the die temperature of the integrated circuit to avoid an integrated circuit malfunction due to an undesirable temperature condition.
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Boyle Steven R.
Gauthier Claude R.
Gold Spencer M.
House Kenneth A.
Siegel Joseph
Lahive & Cockfield LLP
Nghiem Michael
Sun Xiuqin
Sun Microsystems Inc.
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