Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-04-12
2005-04-12
Thomas, Tom (Department: 2815)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S258000, C438S260000, C438S261000, C438S267000, C257S314000, C257S315000, C257S316000, C257S317000, C257S318000
Reexamination Certificate
active
06878589
ABSTRACT:
A method and system for improving short channel effect on a floating gate device is disclosed. In one embodiment, a p-type implant is applied to a source side of the floating gate device. In addition, the present embodiment applies a p-type implant to a drain side of the floating gate device. The p-type implant to the drain side is performed at a different angle than the p-type implant to the source side. The p-type implant to the drain side is implanted to a greater depth than that of the p-type implant to the source side.
REFERENCES:
patent: 5147811 (1992-09-01), Sakagami
patent: 5780912 (1998-07-01), Burr et al.
patent: 5920776 (1999-07-01), Fratin et al.
patent: 6284603 (2001-09-01), Ho Simon et al.
patent: 6380041 (2002-04-01), Yeap et al.
patent: 6518122 (2003-02-01), Chan et al.
patent: 6541821 (2003-04-01), Krishnan et al.
patent: 6630385 (2003-10-01), Yu
patent: 6706582 (2004-03-01), Yanagida et al.
patent: 6713812 (2004-03-01), Hoefler et al.
patent: 20010012672 (2001-08-01), Dennison et al.
patent: 20030134474 (2003-07-01), Chan et al.
Fastow Richard
Guo Xin
He Yue-Song
Advanced Micro Devices , Inc.
Fenty Jesse A.
Thomas Tom
LandOfFree
Method and system for improving short channel effect on a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for improving short channel effect on a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for improving short channel effect on a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3369617