Method and system for evaluating the quality of holograms

Details Method and system for evaluating the quality of holograms Method and system for evaluating the quality of holograms

1998-02-05

2000-01-11

Henry, Jon

Optics: measuring and testing

By configuration comparison

With comparison to master, desired shape, or reference voltage

359559, 382211, G02B 2746, G01J 902

Patent

active

060142197

ABSTRACT:
The image quality of a hologram is evaluated by measuring the spacial distributions of luminance of an image reconstructed from the hologram and an object recorded thereon, normalizing the amplitudes of luminance per spacial frequency (which are obtained by Fourier transforms of the spacial distributions measured, respectively) and comparing the amplitudes normalized or obtaining a ratio between the amplitudes normalized.

REFERENCES:
patent: 3782827 (1974-01-01), Nisenson et al.
patent: 5040140 (1991-08-01), Horner
patent: 5724447 (1998-03-01), Fukushima

Affiliated with

Also associated with

Rating

Method and system for evaluating the quality of holograms does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for evaluating the quality of holograms, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for evaluating the quality of holograms will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1466517