Method and system for discretely controllable plasma processing

Electric lamp and discharge devices: systems – Discharge device load with fluent material supply to the... – Plasma generating

Reexamination Certificate

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C315S111810, C216S067000, C427S569000

Reexamination Certificate

active

11083433

ABSTRACT:
A method and system for plasma generation and processing includes a plurality of beam generators each locally controllable and configured for operation upon a single substrate. A control circuit couples to each of the plurality of beam generators with the control circuit configured to independently regulate at least a portion of the plurality of beam generators. A process gas is introduced into an area above a surface of a substrate. A plurality of beam generators is locally controlled and is directed at the process gas. The beam generators independently emit electrons as controlled and at least a portion of the process gas is converted into plasma according to the electrons emitted from the plurality of the independently controllable beam generators. The substrate is processed using the plasma according to local control of each of the plurality of beam generators.

REFERENCES:
patent: 4684848 (1987-08-01), Kaufman et al.
patent: 4749910 (1988-06-01), Hara et al.
patent: 5397958 (1995-03-01), Araki et al.
patent: 5413663 (1995-05-01), Shimizu et al.
patent: 5476182 (1995-12-01), Ishizuka et al.
patent: 5539274 (1996-07-01), Araki et al.
patent: 5601653 (1997-02-01), Ito et al.
patent: 5616368 (1997-04-01), Jin et al.
patent: 5639308 (1997-06-01), Yamazaki et al.
patent: 5841235 (1998-11-01), Engelko et al.
patent: 5874807 (1999-02-01), Neger et al.
patent: 6348158 (2002-02-01), Samukawa
patent: 6368678 (2002-04-01), Bluck et al.
patent: 6624584 (2003-09-01), Schmidt-Boecking et al.
patent: 6650061 (2003-11-01), Urayama et al.
patent: 6700127 (2004-03-01), Schneiker et al.
patent: 7005660 (2006-02-01), Honda et al.
patent: 7023002 (2006-04-01), Nagaseki et al.
patent: 2002/0047544 (2002-04-01), Nishikawa et al.
patent: 2003/0090190 (2003-05-01), Takai et al.
patent: 2003/0224104 (2003-12-01), Fukunaga et al.
patent: 2004/0150312 (2004-08-01), McElrath et al.
patent: 2004/0248040 (2004-12-01), Mitsuoka et al.
Zhao et al., Filed Emission from AIN Nanoneedle Arrays, Applied Physics Letters, vol. 85, No. 22, Nov. 29, 2004, pp. 5331-5333, China.
Cheng et al., Zinc Oxide Single-Crystal Microtubes, Applied Physics Letters, vol. 85, No. 22, Nov. 29, 2004, pp. 5140-5142, China.
Park et al., Fabrication and Photoluminescent Properties of ZnO/ZnMgO Quantum Structure Nanorods, Department of Material Science and Engineering, Puhang University of Science and Technology, Korea.

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