Method and system for debug and test using replicated logic

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S011000, C714S021000, C714S025000, C714S037000, C714S045000, C714S724000, C714S729000, C714S734000, C703S013000, C703S015000, C703S019000, C703S022000, C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07398445

ABSTRACT:
A method and system for debug and test using replicated logic is described. A representation of a circuit is compiled. The circuit includes a replicated portion and delay logic to delay inputs into the replicated portion. The circuit may also include trigger logic and clock control logic to enable execution of the replicated portion of the circuit to be paused when a trigger condition occurs. The compiled representation of the circuit may be programmed into a hardware device. A debugger may then be invoked. One or more triggering signals are selected. For each selected triggering signal, one or more states are selected to setup a trigger condition. The hardware device may then be run. The replicated portion of the circuit will be paused when the trigger condition occurs. The states of registers in the replicated portion of the circuit and the sequence of inputs that led to the trigger condition are recorded. This recorded data may then used to generate a test to be run on a software simulator when the circuit is modified.

REFERENCES:
patent: 5309035 (1994-05-01), Watson, Jr. et al.
patent: 5706473 (1998-01-01), Yu et al.
patent: 5923676 (1999-07-01), Sunter et al.
patent: 6269467 (2001-07-01), Chang et al.
patent: 6519754 (2003-02-01), McElvain et al.
patent: 6580299 (2003-06-01), Horan et al.
patent: 6668364 (2003-12-01), McElvain et al.
patent: 6687882 (2004-02-01), McElvain et al.
patent: 6871329 (2005-03-01), Matsumoto
patent: 6904576 (2005-06-01), Ng et al.
patent: 7010769 (2006-03-01), McElvain et al.
patent: 7055117 (2006-05-01), Yee
patent: 7065481 (2006-06-01), Schubert et al.
patent: 2001/0025369 (2001-09-01), Chang et al.
patent: 2003/0069724 (2003-04-01), Schubert et al.
patent: 2003/0115564 (2003-06-01), Chang et al.
patent: 2004/0030999 (2004-02-01), Ng et al.
patent: 2004/0215435 (2004-10-01), Hunt et al.
patent: 1168206 (2002-01-01), None
Koch et al., “Breakpoints and Breakpoint Detection in Source-Level Emulation”, ACM Transactions on Design Automation Systems, vol. 3 No. 2, Apr. 1998, pp. 209-230.
PCT International Search Report for PCT International Appln No. US03/24601, mailed Apr. 16, 2004 (7 pages).
Koch, Gernot H., et al. “Breakpoints and Breakpoint Detection in Source-Level Emulation,”ACM Transactions on Design Automation of Electronic Systems, 3:2 (Apr. 1998), pp. 209-230.
PCT International Search Report and Written Opinion for PCT International Appln No. US2006/030417, mailed Jan. 8, 2007 (10 pages).
PCT International Search Report and Written Opinion for PCT International Appln No. US2006/013910, mailed Feb. 1, 2007 (12 pages).
PCT International Preliminary Report on Patentability for PCT Appln No. US03/24601, mailed Feb. 12, 2007 (6 pages).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and system for debug and test using replicated logic does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for debug and test using replicated logic, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for debug and test using replicated logic will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2797876

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.