Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2005-12-27
2005-12-27
Bonzo, Bryce P. (Department: 2113)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S037000, C714S048000, C701S029000, C702S183000, C702S185000
Reexamination Certificate
active
06981182
ABSTRACT:
Method and system for processing fault log data from a machine comprising a plurality of respective pieces of equipment are provided. Operational parameter data indicative of operational and/or environmental conditions for the respective pieces of equipment is further processed. The method allows collecting fault log data comprising a plurality of faults from any malfunctioning piece of equipment. The method further allows collecting operational parameter data relatable to each respective time of occurrence of the plurality of faults from the malfunctioning equipment. Respective identifying actions allow identifying a plurality of distinct faults in the fault log data and a plurality of data buckets indicative of respective levels of quantization of each operational parameter. At least one distinct fault cluster is generated from the plurality of distinct faults. Each generated fault cluster is related a respective quantization level of at least one operational parameter to provide at least one fault cluster that may be configurable in at least one of the following cluster configurations: a stand-alone fault cluster configuration and a cluster configuration enhanced with quantized operational parameter data. A plurality of weighted repair and distinct fault cluster combinations enhanceable with quantized operational parameter data is generated. At least one repair for the at least one fault cluster enhanceable with quantized operational parameter data is generated using the plurality of weighted repair and distinct fault cluster combinations enhanceable with quantized operational parameter data.
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Dean Jason A.
Roddy Nicholas E.
Andes William Scott
Beusse Brownlee Wolter Mora & Maire
Bonzo Bryce P.
General Electric Company
Guyton Philip
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