Method and structure of an one time programmable memory...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S257000, C257S315000, C257SE21680

Reexamination Certificate

active

07736967

ABSTRACT:
A structure and a manufacturing method for an OTP-EPROM in an embedded EEPROM integrated circuit structure. The structure has a substrate that includes a surface region. The structure has a gate dielectric is overlying the surface region. The structure also a first OTP-EPROM gate overlying the gate dielectric layer in a first cell region, and an EEPROM floating gate and a select gate overlying the gate dielectric layer in a second cell region. An insulating layer is overlying the first OTP-EPROM gate, the EEPROM floating gate and the select gate. An OTP-EPROM control gate is overlying the insulating layer and coupled to the first OTP-EPROM gate. An EEPROM control gate is overlying the insulating layer and coupled to the EEPROM floating gate.

REFERENCES:
patent: 6287907 (2001-09-01), Ito et al.
patent: 6417044 (2002-07-01), Ono
Hashim and Ayub, “Ono and Tunnel Oxide Characterization and optimization for high speed EEPROM device”, Jurnal Teknologi, 38(D), 2003, pp. 125-136.
Becker et al. “Process and film characterization of low pressure tetraethylorthosilicoate-borophoshosilicate glass”, J.Vac.Sci.Techol. B 4 (3), 1886, pp. 732-744.

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